X-ray part of the electromagnetic spectrum and are expressed in terms of its energy (kilo electron volts - keV) or wavelength (nm nanometers). XRF (XRF) is a consequence of the changes taking place inside an atom. A stable atom consists of a nucleus and electrons orbiting around it. Orbiting electrons are arranged in shells: each shell is composed of electrons with the same energy. When a high incident energy (primary) X-ray collides with an atom disturbs this stability. An electron is ejected from a low energy level (eg, layer K: see diagram) and a space is created. As a result an electron from a higher energy level (for example, the L shell) falls into this space.
The difference in energy produced as the electron moves between these levels is released as secondary X-rays which are characteristic of the element. This process is called XRF.
XRF is a proven technique for analyzing materials in a wide range of industries and applications; Positive Material Identification, classification scrap metal, measuring sulfur oil, coating thickness analysis of metals and metal finishing to quality control in electronics and consumer goods alloys.
Benefit analysis include x-ray fluorescence:
Minimal or no sample preparation
NA11 analysis U92, ppm concentration range high%
No wet chemistry - no acid, no reagents
Analysis of solids, liquids, powders, films, granules etc.
Quick Scan - results in minutes
Qualitative, semi-quantitative, to a complete quantitative analysis
For routine quality control analysis tool can be "used by anyone"
XRF is an easy to use, the quality control method of quickly and accurately for a wide range of industries and applications.
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