Jun 30th, 2015
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American Graduate University
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Several methods have been developed for the determination of the complex refractive index N = n +ik of a thin absorbing film deposited onto a transparent substrate ~, 2 using reflection and transmission measurements. Some researchers 3 7 have proposed the determination of N and the film thickness h using experimental values of the transmittance Tand the reflectances R and R' (measured from the film and substrate sides respectively) at normal.

Thin Solid Films, 100(1983) 155-167ELECTRONICSAND OPTICS155A M E T H O D FOR T H E D E T E R M I N A T I O N OF THE C O M P L E XR E F R A C T I V E I N D E X OF N O N - M E T A L L I C T H I N

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